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Micro and nano mechanical testing of materials and devices /

Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Li, James C. M. (James Chen-Min), 1925-, Yang, Fuqian
Format: eBook
Language:English
Published: New York : Springer, [2008]
Subjects:
Materials > Testing.
Microelectromechanical systems > Testing.
Nanoelectromechanical systems > Testing.
Electronic books.
Online Access:Connect to the full text of this electronic book
Description
Item Description:Electronic resource.
Physical Description:xiii, 387 pages : illustrations ; 24 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0387787011
9780387787015
DOI:10.1007/978-0-387-78701-5