Characterization of semiconductor heterostructures and nanostructures /

Bibliographic Details
Corporate Author:	ScienceDirect (Online service)
Other Authors:	Lamberti, Carlo
Format:	eBook
Language:	English
Published:	Amsterdam ; Oxford : Elsevier, 2008.
Edition:	1st ed.
Subjects:	Semiconductors. Heterostructures. Nanostructures. Electronic books.
Online Access:	Connect to the full text of this electronic book

Table of Contents:

Chapter 1. Introduction (C. Lamberti)
Chapter 2. Ab-initio studies of structural and electronic properties (M. Peressi, A. Baldereschi and S. Baroni)
Chapter 3. Electrical and optical properties of heterostructures (TBC)
Chapter 4. Strain and composition determination in semiconducting heterostructures by high resolution X-ray diffraction (C. Ferrari and C. Bocchi)
Chapter 5. Transmission Electron Microscopy techniques for imaging and composition evaluation in Semiconductor Heterostructures (L. Lazzarini, L. Nasi and V. Grillo)
Chapter 6. Accessing structural and electronic properties of semiconductor nanostructures via photoluminescence (S. Sanguinetti, M. Guzzi and M. Gurioli)
Chapter 7. Power dependent cathodoluminescence in III-Nitrides heterostructures: from internal field screening to controlled band gap modulation (G. Salviati, L. Lazzarini, N. Armani, F. Rossi and V. Grillo)
Chapter 8. Raman Spectroscopy (D. Wolverson)
Chapter 9. X-ray absorption fine structure spectroscopy (F. Boscherini)
Chapter 10. Nanostructures in the light of synchrotron radiation: surface sensitive x-ray techniques and anomalous scattering (T. Metzger, J. Eymery, V. Favre-Nicolin, G. Renaud, H. Renevier and T. Schulli)
Chapter 11. Grazing Incidence Diffraction Anomalous Fine Structure to study the structural properties of semiconductor nanostructures (M. Grazia Proietti, J. Coraux and H. Renevier)
Chapter 12. The Role of Photoemission Spectroscopies in Heterojunction Research (G. Margaritondo)
Chapter 13. EPR of interfaces and nanolayers in semiconductor heterostructures (A. Stesmans and V.V. Afans'ev).
Introduction: the interdisciplinary nature of nanotechnology and its need to exploit frontier characterization techniques / Carlo Lamberti
Ab initio studies of structural and electronic properties / Maria Peressi, Alfonso Baldereschi, and Stefano Baroni
Electrical characterization of nanostructures / Anna Cavallini and Laura Polenta
Strain and composition determination in semiconducting heterostructures by high-resolution X-ray diffraction / Claudio Ferrari and Claudio Bocchi
Transmission electron microscopy techniques for imaging and compositional evaluation in semiconductor heterostructures / Laura Lazzarini, Lucia Nasi, and Vincenzo Grillo
Accessing structural and electronic properties of semiconductor nanostructures via photoluminescence / Stefano Sanguinetti, Mario Guzzi, and Massimo Gurioli
Power-dependent cathodoluminescence in III-nitrides heterostructures: from internal field screening to controlled band-gap modulation / Giancarlo Salviati, Francesca Rossi, Nicola Armani, Vincenzo Grillo, and Laura Lazzarini
Raman spectroscopy / Daniel Wolverson
X-ray absorption fine structure in the study of semiconductor heterostructures and nanostructures / Federico Boscherini
Nanostructures in the light of synchrotron radiation: surface-sensitive X-ray techniques and anomalous scattering / Till Metzger, Vincent Favre-Nicolin, Gilles Renaud, Hubert Renevier, and Tobias Schülli
Grazing incidence diffraction anomalous fine structure in the study of structural properties of nanostructures / Maria Grazia Proietti, Johann Coraux, and Hubert Renevier
The role of photoemission spectroscopies in heterojunction research / Giorgio Margaritondo
ESR of interfaces and nanolayers in semiconductor heterostructures / Andre Stesmans and Valery V. Afanasʹev.