Accelerated stress testing and diagnostic analysis of degradation in CdTe solar cells /

Bibliographic Details
Main Author: Albin, David S.
Corporate Author: National Renewable Energy Laboratory (U.S.)
Format: Government Document eBook
Language:English
Published: [Golden, Colo.] : National Renewable Energy Laboratory, [2008]
Series:Conference paper (National Renewable Energy Laboratory (U.S.)) ; 520-42811.
Subjects:
Online Access:https://purl.fdlp.gov/GPO/LPS111369
Description
Abstract:The primary goal of this study was to ascertain the presence and types of mechanisms affecting CdS/CdTe device stability in the temperature range of 60 to 120 degrees C. It should be noted that the results presented were specific to cells made using the specific growth conditions described.
Item Description:Title from title screen (viewed on May 28, 2009).
"Presented at the 2008 SPIE Optics+Photonics Meeting Reliability of Photovoltaic Cells, Modules, Components and Systems, San Diego, California, August 10-14, 2008."
"November 2008."
Electronic resource.
Physical Description:10 pages : digital, PDF file.
Format:Mode of access: Internet from the NREL web site. Address as of 5/28/09: http://www.nrel.gov/docs/fy09osti/42811.pdf ; current access available via PURL.