Quality aspects in spatial data mining /

Bibliographic Details
Other Authors: Stein, Alfred, Shi, Wenzhong, Bijker, Wietske, 1965-
Format: Book
Language:English
Published: Boca Raton : CRC Press, [2009]
Subjects:
Description
Physical Description:xx, 364 pages : illustrations, maps ; 25 cm.
Bibliography:Includes bibliographical references and index.
ISBN:9781420069266 (alk. paper)
1420069268 (alk. paper)