Evaluation of four imaging techniques for the electrical characterization of solar cells : preprint /
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| Format: | Government Document eBook |
| Language: | English |
| Published: |
[Golden, Colo.] :
National Renewable Energy Laboratory,
[2008]
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| Series: | Conference paper (National Renewable Energy Laboratory (U.S.)) ;
NREL/CP-520-44607. |
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| Online Access: | https://purl.fdlp.gov/GPO/LPS110431 |
| Abstract: | We evaluate four techniques that image minority-carrier lifetime, carrier diffusion length, and shunting in solar cells. The techniques include photoluminescence imaging, carrier-density imaging, electroluminescence imaging, and dark lock-in thermography shunt detection. We compare these techniques to current industry standards and show how they can yield similar results with higher resolution and in less time. |
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| Item Description: | Title from title screen (viewed January 2, 2009). "Presented at the 2008 Materials Research Society (MRS) Fall Meeting, Boston, Massachusetts, November 30 - December 5, 2008." "December 2008." Electronic resource. |
| Physical Description: | 6 pages : digital, PDF file. |
| Format: | Mode of access: Internet from the NREL web site. Address as of 3/19/09: http://www.nrel.gov/docs/fy09osti/44607.pdf ; current access available via PURL. |