Scanning probe microscopy : atomic scale engineering by forces and currents /
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| Format: | eBook |
| Language: | English |
| Published: |
New York :
Springer Science+Business,
[2006]
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| Series: | Nanoscience and technology.
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| Online Access: | Connect to the full text of this electronic book Publisher description |
| Item Description: | Electronic resource. |
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| Physical Description: | xiv, 281 pages : illustrations ; 25 cm. |
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 0387372318 9780387372310 |
| DOI: | 10.1007/0-387-37231-8 |