APA (7th ed.) Citation

Foster, A., & Hofer, W. (2006). Scanning probe microscopy: Atomic scale engineering by forces and currents. Springer Science+Business. https://doi.org/10.1007/0-387-37231-8

Chicago Style (17th ed.) Citation

Foster, A., and Werner Hofer. Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents. New York: Springer Science+Business, 2006. https://doi.org/10.1007/0-387-37231-8.

MLA (9th ed.) Citation

Foster, A., and Werner Hofer. Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents. Springer Science+Business, 2006. https://doi.org/10.1007/0-387-37231-8.