rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Best practices in software measurement
    sub title: how to use metrics to improve project and process performance
  name:
    name part: Ebert, Christof.
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  genre: bibliography
  genre: Electronic books.
  origin info:
    place:
      place term: gw
    date issued: 2005
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: electronic
    form: remote
    extent: xi, 295 pages : illustrations ; 24 cm.
  note: Christof Ebert [and others].
  note: Electronic resource.
  note: Electronic reproduction. New York : Springer, 2008. Mode of access: World Wide Web. System requirements: Web browser. Title from title screen (viewed on Oct. 10, 2008). Access may be restricted to users at subscribing institutions.
  note: Includes bibliographical references and index.
  subject:
    topic: Software measurement
  subject:
    topic: Mesure du logiciel
  classification: QA76.76.S65 B46 2005eb
  classification: 005.14
  related item:
    identifier: (DLC) 2004110442
    identifier: (OCoLC)56442802
  identifier: 3540267344
  identifier: 9783540267348
  identifier: 978-3-540-20867-9 Springer
  identifier: http://proxy.library.tamu.edu/login
  identifier: http://www.loc.gov/catdir/enhancements/fy0818/2004110442-b.html
  identifier: http://www.loc.gov/catdir/enhancements/fy0818/2004110442-d.html
  related item:
    location:
      url: http://www.loc.gov/catdir/enhancements/fy0818/2004110442-b.html
  related item:
    location:
      url: http://www.loc.gov/catdir/enhancements/fy0818/2004110442-d.html
  record info:
    record content source: GW5XE
    record creation date: 081017
    record change date: 20210727074439.0
    record identifier: in00002474243
    language of cataloging:
      language term: eng