MARC

Tag First Indicator Second Indicator Subfields
LEADER 00000cam a2200000Ia 4500
001 in00002470921
005 20210817091341.0
006 m d
007 cr cn|||||||||
008 080226s2006 nyua sb 001 0 eng d
020 |a 0387281339 
020 |a 9780387281339 
029 1 |a AU@  |b 000042134849 
029 1 |a AU@  |b 000043179809 
035 |a (OCoLC)209908125 
035 |a (OCoLC)ocn209908125 
037 |a 978-0-387-25737-2  |b Springer  |n http://www.springerlink.com 
040 |a GW5XE  |c GW5XE  |d UtOrBLW 
049 |a TEFA 
050 1 4 |a TK7871.99.M44  |b L43 2006eb 
082 0 4 |a 621.38412  |2 22 
245 0 0 |a Leakage in nanometer CMOS technologies /  |c [ed. by] Siva G. Narendra, Anantha Chandrakasan. 
264 1 |a New York :  |b Springer,  |c 2006. 
300 |a x, 307 pages :  |b illustrations ;  |c 24 cm. 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
490 1 |a Series on integrated circuits and systems 
500 |a Electronic resource. 
504 |a Includes bibliographical references and index. 
505 0 0 |t Taxonomy of leakage : sources, impact, and solutions -  |t Leakage dependence on input vector /  |r Siva Narendra ... [et al.] -  |t Power gating and dynamic voltage scaling /  |r Benton Calhoun, James Kao, and Anantha Chandrakasan -  |t Methodologies for power gating /  |r Kimiyoshi Usami and Takayasu Sakurai -  |t Body biasing /  |r Tadahiro Kuroda and Takayasu Sakurai -  |t Process variation and adaptive design /  |r Siva Narendra ... [et al.] -  |t Memory leakage reduction /  |r Takayuki Kawahara and Kiyoo Itoh -  |t Active leakage reduction and multi-performance devices /  |r Siva Narendra ... [et al.] -  |t Impact of leakage power and variation on testing /  |r Ali Keshavarzi and Kaushik Roy -  |t Case study : leakage reduction in Hitachi/Renesas microprocessors /  |r Masayuki Miyazaki, Hiroyuki Mizuno, and Takayuki Kawahara -  |t Case study : leakage reduction in the Intel Xscale microprocessor /  |r Lawrence Clark - Transistor design to reduce leakage /  |r Sagar Suthram, Siva Narendra, and Scott Thompson. 
533 |a Electronic reproduction.  |b New York :  |c Springer,  |d 2008.  |n Mode of access: World Wide Web.  |n System requirements: Web browser.  |n Title from title screen (viewed on Jan. 30, 2008).  |n Access may be restricted to users at subscribing institutions. 
650 0 |a Electric leakage  |x Prevention. 
650 0 |a Integrated circuits  |x Design and construction.  |0 http://id.loc.gov/authorities/subjects/sh85067118 
650 0 |a Metal oxide semiconductors, Complementary  |x Design and construction.  |0 http://id.loc.gov/authorities/subjects/sh2008107701 
655 7 |a Electronic books.  |2 local 
700 1 |a Chandrakasan, Anantha P.  |0 http://id.loc.gov/authorities/names/n95035281 
700 1 |a Narendra, Siva G.  |q (Siva Gurusami),  |d 1971- 
710 2 |a SpringerLink (Online service)  |0 http://id.loc.gov/authorities/names/no2005046756 
776 1 |c Original  |z 0387257373  |z 9780387257372  |z 0387281339  |z 9780387281339  |w (DLC) 2005932184  |w (OCoLC)62510295 
830 0 |a Series on integrated circuits and systems.  |0 http://id.loc.gov/authorities/names/no2006011176 
856 4 0 |u http://proxy.library.tamu.edu/login?url=https://dx.doi.org/10.1007/0-387-28133-9  |z Connect to the full text of this electronic book  |t 0 
994 |a C0  |b TEF 
999 |a MARS 
999 f f |s 1020056a-422f-36a4-bba2-a97a001b43ac  |i 620ac60d-84e3-3107-81dc-5d812ac27fef  |t 0 
952 f f |a Texas A&M University  |b College Station  |c Electronic Resources  |d Available Online  |t 0  |e TK7871.99.M44 L43 2006eb  |h Library of Congress classification 
998 f f |a TK7871.99.M44 L43 2006eb  |t 0  |l Available Online