SpringerLink (Online service), Ishibashi, Y., & Okuyama, M. (2005). Ferroelectric thin films: Basic properties and device physics for memory applications. Springer. https://doi.org/10.1007/b99517
Chicago Style (17th ed.) CitationSpringerLink (Online service), Yoshihiro Ishibashi, and Masanori Okuyama. Ferroelectric Thin Films: Basic Properties and Device Physics for Memory Applications. Berlin ; New York: Springer, 2005. https://doi.org/10.1007/b99517.
MLA (9th ed.) CitationSpringerLink (Online service), et al. Ferroelectric Thin Films: Basic Properties and Device Physics for Memory Applications. Springer, 2005. https://doi.org/10.1007/b99517.
Warning: These citations may not always be 100% accurate.