Lifetime spectroscopy : a method of defect characterization in silicon for photovoltaic applications /
| Main Author: | |
|---|---|
| Corporate Author: | |
| Format: | eBook |
| Language: | English |
| Published: |
Berlin ; New York :
Springer,
[2005]
|
| Series: | Springer series in materials science ;
v. 85. |
| Subjects: | |
| Online Access: | Connect to the full text of this electronic book |
| Item Description: | Electronic resource. |
|---|---|
| Physical Description: | xxvi, 489 pages : illustrations (some color) ; 25 cm. |
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 3540279229 9783540279228 |
| ISSN: | 0933-033X ; |
| DOI: | 10.1007/3-540-27922-9 |