Ellipsometry in the measurement of surfaces and thin films ; symposium proceedings.

Bibliographic Details

Corporate Author:	Symposium on the Ellipsometer and its Use in the Measurement of Surfaces and Thin Films Washington, D.C.
Other Authors:	Passaglia, Elio (Editor), Stromberg, Robert R. (Editor), Kruger, Jerome (Editor)
Format:	Government Document Conference Proceeding Book
Language:	English
Published:	Washington : U.S. National Bureau of Standards, 1964.
Series:	United States. National Bureau of Standards. Miscellaneous publication ; 256
Subjects:	Polarization (Light) Surfaces (Technology) Thin films.