APA (7th ed.) Citation

Symposium on the Ellipsometer and its Use in the Measurement of Surfaces and Thin Films Washington, D.C., Passaglia, E., Stromberg, R. R., & Kruger, J. (1964). Ellipsometry in the measurement of surfaces and thin films: Symposium proceedings. U.S. National Bureau of Standards.

Chicago Style (17th ed.) Citation

Symposium on the Ellipsometer and its Use in the Measurement of Surfaces and Thin Films Washington, D.C., Elio Passaglia, Robert R. Stromberg, and Jerome Kruger. Ellipsometry in the Measurement of Surfaces and Thin Films: Symposium Proceedings. Washington: U.S. National Bureau of Standards, 1964.

MLA (9th ed.) Citation

Symposium on the Ellipsometer and its Use in the Measurement of Surfaces and Thin Films Washington, D.C., et al. Ellipsometry in the Measurement of Surfaces and Thin Films: Symposium Proceedings. U.S. National Bureau of Standards, 1964.