rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Optical interferometry
  title info:
    title: Referex
  name:
    name part: Hariharan, P.
    role:
      role term: creator
  type of resource: text
  genre: bibliography
  genre: Electronic books.
  origin info:
    place:
      place term: ne
    date issued: 2003
    edition: 2nd ed.
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: electronic
    form: remote
    extent: xvi, 351 pages : illustrations ; 24 cm.
  abstract: When the first edition of "Optical Interferometry" was published, interferometry was regarded as a rather esoteric method of making measurements, largely confined to the laboratory. Today, however, besides its use in several fields of research, it has applications in fields as diverse as measurement of length and velocity, sensors for rotation, acceleration, vibration and electrical and magnetic fields, as well as in microscopy and nanotechnology. Most topics are discussed first at a level accessible to anyone with a basic knowledge of physical optics, then a more detailed treatment of the topic is undertaken, and finally each topic is supplemented by a reference list of more than 1000 selected original publications in total. * Historical development of interferometry * The laser as a light source * Two-beam interference * Techniques for frequency stabilization * Coherence * Electronic phase measurements * Multiple-beam interference * Quantum effects in optical interference * Extensive coverage of the applications of interferometry, such as measurements of length, optical testing, interference microscopy, interference spectroscopy, Fourier-transform spectroscopy, interferometric sensors, nonlinear interferometers, stellar interferometry, and studies of space-time and gravitation.
  table of contents: Optical interferometry; Two-beam interference; Coherence; Multiple-beam interference; The laser as a light source; Electronic techniques; Measurements of length; Optical testing; Interference microscopy; Interferometric sensors; Interference spectroscopy; Fourier-transform spectroscopy; Nonlinear interferometers; Stellar interferometry; Space-time and gravitation; Single-photon interferometry; Fourth-order interference; Two-photon interferometry.
  note: by P. Hariharan.
  note: Electronic resource.
  note: Electronic reproduction. Amsterdam : Elsevier Science & Technology, 2007. Mode of access: World Wide Web. System requirements: Web browser. Title from title screen (viewed on Aug. 2, 2007). Access may be restricted to users at subscribing institutions.
  note: Includes bibliographical references (pages 309-342) and index.
  subject:
    topic: Interferometry
  classification: QC411 .H37 2003eb
  classification: 535/.47/0287
  related item:
    identifier: (DLC) 2003050272
    identifier: (OCoLC)52107471
  identifier: 9780123116307
  identifier: 0123116309
  identifier: 91338:91335 Elsevier Science & Technology
  identifier: http://proxy.library.tamu.edu/login
  identifier: http://www.loc.gov/catdir/toc/els051/2003050272.html
  identifier: http://www.loc.gov/catdir/description/els041/2003050272.html
  related item:
    location:
      url: http://www.loc.gov/catdir/toc/els051/2003050272.html
  related item:
    location:
      url: http://www.loc.gov/catdir/description/els041/2003050272.html
  record info:
    record content source: OPELS
    record creation date: 070806
    record change date: 20260609193712.2
    record identifier: in00002425442