http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
Semiconductor material and device characterization
Resistivity -- Carrier and doping density -- Contact resistance and Schottky barriers -- Series resistance, channel length and width, and threshold voltage -- Defects -- Oxide and interface trapped charges, oxide thickness -- Carrier lifetimes -- Mobility -- Charge-based and probe characterization -- Optical characterization -- Chemical and physical characterization -- Reliability and failure analysis.
Electronic reproduction. Boulder, Colo. : Wiley InterScience, 2006. Available via World Wide Web. Access may be limited to Wiley InterScience affiliated libraries.
Includes bibliographical references and index.