rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Semiconductor material and device characterization
  name:
    name part: Schroder, Dieter K.
    role:
      role term: creator
  name:
    name part: Wiley InterScience (Online service)
  type of resource: text
  genre: bibliography
  genre: Electronic books.
  origin info:
    place:
      place term: nju
    date issued: 2006
    edition: 3rd ed.
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: electronic
    form: remote
    extent: xv, 779 pages : illustrations ; 25 cm.
  table of contents: Resistivity -- Carrier and doping density -- Contact resistance and Schottky barriers -- Series resistance, channel length and width, and threshold voltage -- Defects -- Oxide and interface trapped charges, oxide thickness -- Carrier lifetimes -- Mobility -- Charge-based and probe characterization -- Optical characterization -- Chemical and physical characterization -- Reliability and failure analysis.
  note: Dieter K. Schroder.
  note: "Wiley-Interscience."
  note: Electronic resource.
  note: Electronic reproduction. Boulder, Colo. : Wiley InterScience, 2006. Available via World Wide Web. Access may be limited to Wiley InterScience affiliated libraries.
  note: Includes bibliographical references and index.
  subject:
    topic: Semiconductors
    topic: Testing
  subject:
    topic: Semiconductors
  classification: QC611 .S335 2006
  classification: 621.3815/2
  related item:
    identifier: (DLC) 2005048514
    identifier: (OCoLC)59360243
  identifier: 0471749095
  identifier: 9780471749097
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: AZU
    record creation date: 070807
    record change date: 20210810091233.0
    record identifier: in00002403073