Mathematical models for systems reliability /

Bibliographic Details
Main Author: Epstein, Benjamin, 1918-
Other Authors: Weissman, Ishay, 1940-
Format: Book
Language:English
Published: Boca Raton : CRC Press, [2008]
Subjects:
Description
Item Description:"A Chapman & Hall book."
Physical Description:253 pages : illustrations ; 25 cm.
Bibliography:Includes bibliographical references (pages 247-250) and index.
ISBN:9781420080827 (alk. paper)
1420080822 (alk. paper)