rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Fundamentals of nanoscale film analysis
  name:
    name part: Alford, Terry L.
    role:
      role term: creator
  name:
    name part: Feldman, Leonard C.
  name:
    name part: Mayer, James W.
    name part: 1930-
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  genre: bibliography
  genre: Electronic books.
  origin info:
    place:
      place term: nyu
    date issued: 2007
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: electronic
    form: remote
    extent: xiv, 336 pages : illustrations ; 25 cm.
  note: Terry L. Alford, Leonard C. Feldman and James W. Mayer.
  note: Electronic resource.
  note: Electronic reproduction. New York : Springer, 2007. Mode of access: World Wide Web. System requirements: Web browser. Title from title screen (viewed on Dec. 13, 2007). Access may be restricted to users at subscribing institutions.
  note: Includes bibliographical references and index.
  subject:
    topic: Nanostructured materials
  subject:
    topic: Thin films
  classification: QC176.83 .A44 2007eb
  classification: 621.3815/2
  related item:
    identifier: (DLC) 2005933265
    identifier: (OCoLC)124465046
  identifier: 0387292616
  identifier: 9780387292618
  identifier: 978-0-387-29260-1 Springer
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: GW5XE
    record creation date: 071219
    record change date: 20210803090723.0
    record identifier: in00002382171