Fundamentals of nanoscale film analysis /

Bibliographic Details
Main Author:	Alford, Terry L.
Corporate Author:	SpringerLink (Online service)
Other Authors:	Feldman, Leonard C., Mayer, James W., 1930-
Format:	eBook
Language:	English
Published:	New York, N.Y. ; London : Springer, [2007]
Subjects:	Nanostructured materials. Thin films. Electronic books.
Online Access:	Connect to the full text of this electronic book

Description
Item Description:	Electronic resource.
Physical Description:	xiv, 336 pages : illustrations ; 25 cm.
Bibliography:	Includes bibliographical references and index.
ISBN:	0387292616 9780387292618
DOI:	10.1007/978-0-387-29261-8