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Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale /

Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Gruverman, A. (Alexei), Kalinin, S. V. (Sergeĭ Vasilʹevich)
Format: eBook
Language:English
Published: New York : Springer, [2007]
Subjects:
Nanoelectronics.
Scanning probe microscopy.
Electronic books.
Online Access:Connect to the full text of this electronic book
Description
Item Description:Electronic resource.
Physical Description:2 volumes (xx, 980 pages, 8 unnumbered pages of plates) : illustrations (some color) ; 25 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0387286683
9780387286686
DOI:10.1007/978-0-387-28668-6