APA (7th ed.) Citation

SpringerLink (Online service), Gruverman, A., & Kalinin, S. V. (2007). Scanning probe microscopy: Electrical and electromechanical phenomena at the nanoscale. Springer. https://doi.org/10.1007/978-0-387-28668-6

Chicago Style (17th ed.) Citation

SpringerLink (Online service), A. Gruverman, and S. V. Kalinin. Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale. New York: Springer, 2007. https://doi.org/10.1007/978-0-387-28668-6.

MLA (9th ed.) Citation

SpringerLink (Online service), et al. Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale. Springer, 2007. https://doi.org/10.1007/978-0-387-28668-6.