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Quantum electronics metrology : 20-21 January 2008, San Jose, California, USA /

Bibliographic Details
Corporate Author:	Society of Photo-optical Instrumentation Engineers
Other Authors:	Craig, Alan Ellsworth, Shahriar, Selim M.
Format:	Book
Language:	English
Published:	Bellingham, Washington : SPIE, [2008]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 6906.
Subjects:	Quantum electronics > Congresses. Metrology > Congresses. Physical measurements > Congresses. Coherence (Optics) > Congresses.
Online Access:	https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/6906.toc

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