Quantum electronics metrology : 20-21 January 2008, San Jose, California, USA /

Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Craig, Alan Ellsworth, Shahriar, Selim M.
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2008]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 6906.
Subjects:
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/6906.toc

MARC

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