Cover Image

Quantum electronics metrology : 20-21 January 2008, San Jose, California, USA /

Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Craig, Alan Ellsworth, Shahriar, Selim M.
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2008]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 6906.
Subjects:
Quantum electronics > Congresses.
Metrology > Congresses.
Physical measurements > Congresses.
Coherence (Optics) > Congresses.
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/6906.toc
Description
Physical Description:1 volume (various pagings) : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:9780819470812
0819470813