rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: System-on-chip test architectures
    sub title: nanometer design for testability
  name:
    name part: Wang, Laung-Terng.
  name:
    name part: Stroud, Charles E.
  name:
    name part: Touba, Nur A.
  type of resource: text
  genre: bibliography
  origin info:
    place:
      place term: ne
    date issued: 2008
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: print
    extent: xxxvi, 856 pages : illustrations ; 25 cm.
  note: edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba.
  note: Includes bibliographical references and index.
  subject:
    topic: Systems on a chip
    topic: Testing
  subject:
    topic: Integrated circuits
    topic: Very large scale integration
    topic: Testing
  subject:
    topic: Integrated circuits
    topic: Very large scale integration
    topic: Design
  classification: TK7895.E42 S978 2008
  classification: 621.39/5
  related item:
    title info:
      title: Morgan Kaufmann series in systems on silicon
  identifier: 9780123739735 (hardcover : alk. paper)
  identifier: 012373973X (hardcover : alk. paper)
  identifier: 2007023373
  identifier: http://www.loc.gov/catdir/toc/ecip0719/2007023373.html
  related item:
    location:
      url: http://www.loc.gov/catdir/toc/ecip0719/2007023373.html
  record info:
    record content source: DLC
    record creation date: 070604
    record change date: 20151108072801.0
    record identifier: in00002351113