Society of Photo-optical Instrumentation Engineers, Postek, M. T., & Allgair, J. (2007). Instrumentation, metrology, and standards for nanomanufacturing: 29-30 August 2007, San Diego, California, USA. SPIE.
Chicago Style (17th ed.) CitationSociety of Photo-optical Instrumentation Engineers, Michael T. Postek, and John Allgair. Instrumentation, Metrology, and Standards for Nanomanufacturing: 29-30 August 2007, San Diego, California, USA. Bellingham, Washington: SPIE, 2007.
MLA (9th ed.) CitationSociety of Photo-optical Instrumentation Engineers, et al. Instrumentation, Metrology, and Standards for Nanomanufacturing: 29-30 August 2007, San Diego, California, USA. SPIE, 2007.
Warning: These citations may not always be 100% accurate.