Cover Image

Image pattern recognition : synthesis and analysis in biometrics /

Bibliographic Details
Other Authors: Yanushkevich, Svetlana N., Nixon, Mark S.
Format: Book
Language:English
Published: Singapore ; Hackensack, NJ : World Scientific, [2007]
Series:Series in machine perception and artificial intelligence ; v. 67.
Subjects:
Pattern recognition systems > Congresses.
Pattern recognition systems > Mathematical models > Congresses.
Biometric identification > Congresses.
Identification > Automation > Congresses.
Artificial intelligence > Congresses.
Description
Item Description:"Some of the new ideas were first presented at the international workshop on 'Biometric Technologies: Modeling and Simulation' held in June 2004 in Calgary, Canada."--P. vi.
Physical Description:xxi, 430 pages : illustrations ; 24 cm.
Bibliography:Includes bibliographical references and indexes.
ISBN:9789812569080
9812569081