A statistical test suite for random and pseudorandom number generators for cryptographic applications /

Bibliographic Details
Main Author: Rukhin, Andrew L.
Corporate Author: National Institute of Standards and Technology (U.S.)
Format: Government Document Book
Language:English
Published: [Gaithersburg, Md.] : [U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology], [2001]
Edition:Rev.
Series:NIST special publication ; 800-22.
Subjects:
Online Access:https://purl.fdlp.gov/GPO/LPS72078
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Published 2008
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