Journey to data quality /

Bibliographic Details
Other Authors: Lee, Yang W.
Format: Book
Language:English
Published: Cambridge, Mass. : MIT Press, [2006]
Subjects:
Description
Physical Description:xii, 226 pages : illustrations ; 24 cm.
Bibliography:Includes bibliographical references (pages [215]-221) and index.
ISBN:0262122871 (alk. paper)
9780262122870 (alk. paper)
9780262122870 (hbk.)