AFM-based microelectrical characterization of grain boundaries in Cu(In,Ga)Se₂ thin films /

Bibliographic Details
Corporate Author: National Renewable Energy Laboratory (U.S.)
Other Authors: Jiang, C.-S
Format: Government Document Book
Language:English
Published: Golden, Colo. : National Renewable Energy Laboratory, [2005]
Series:Conference paper ; NREL/CP-520-37338
Subjects:
Online Access:https://purl.fdlp.gov/GPO/LPS68173
Description
Item Description:"February 2005."
"Prepared for the 31st IEEE Photovoltaics Specialists Conference and Exhibition, Lake Buena Vista, Florida, January 3-7, 2005"
Title from title screen (viewed on Mar. 27, 2006).
Electronic resource.
Physical Description:1 volume : digital, PDF file.
Format:Mode of access: Internet from the NREL web site. Address as of 3/27/06: http://www.nrel.gov/docs/fy05osti/37338.pdf; current access available via PURL.