APA (7th ed.) Citation

National Renewable Energy Laboratory (U.S.) & Jiang, C. (2005). AFM-based microelectrical characterization of grain boundaries in Cu(In,Ga)Se₂ thin films. National Renewable Energy Laboratory.

Chicago Style (17th ed.) Citation

National Renewable Energy Laboratory (U.S.) and C.-S Jiang. AFM-based Microelectrical Characterization of Grain Boundaries in Cu(In,Ga)Se₂ Thin Films. Golden, Colo.: National Renewable Energy Laboratory, 2005.

MLA (9th ed.) Citation

National Renewable Energy Laboratory (U.S.) and C.-S Jiang. AFM-based Microelectrical Characterization of Grain Boundaries in Cu(In,Ga)Se₂ Thin Films. National Renewable Energy Laboratory, 2005.