Crystalline silicon short-circuit current degradation study : initial results /

Bibliographic Details
Main Author:	Osterwald, C. R.
Corporate Author:	National Renewable Energy Laboratory (U.S.)
Other Authors:	Pruett, J., Moriarty, T.
Format:	Government Document Book
Language:	English
Published:	Golden, Colo. : National Renewable Energy Laboratory, [2005]
Series:	Conference paper ; NREL/CP-520-37357
Subjects:	Silicon > Electric properties. Short circuits.
Online Access:	https://purl.fdlp.gov/GPO/LPS69351

Description
Item Description:	"February 2005." "Prepared for the 31st IEEE Photovoltaics Specialists Conference and Exhibition, Lake Buena Vista, Florida, January 3-7, 2005." Title from title screen (viewed on Apr. 27, 2006). Electronic resource.
Physical Description:	1 volume : digital, PDF file.
Format:	Mode of access: Internet from the NREL web site. Address as of 4/27/06: http://www.nrel.gov/docs/fy05osti/37357.pdf; current access available via PURL.