Voltage sensing based built-in current sensor for I [subscript DDQ] test /
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Thesis eBook |
| Language: | English |
| Published: |
[College Station, Tex.] :
[Texas A&M University],
[2006]
|
| Subjects: | |
| Online Access: | Link to OAK Trust copy |
| Abstract: | Quiescent current leakage test of the V [subscript DD] supply (I [subscript DDQ] Test) has been proven an effective way to screen out defective chips in manufacturing of Integrated Circuits (IC). As technology advances, the traditional I [subscript DDQ] test is facing more and more challenges. In this research, a practical built-in current sensor (BICS) is proposed and the design is verified by three generations of test chips. The BICS detects the signal by sensing the voltage drop on supply lines of the circuit under test (CUT). Then the sensor performs analog-to-digital conversion of the input signal using a stochastic process with scan chain readout. Self-calibration and digital chopping are used to minimize offset and low frequency noise and drift. This non-invasive procedure avoids any performance degradation of the CUT. The measurement results of test chips are presented. The sensor achieves a high I [subscript DDQ] resolution with small chip area overhead. This will enable I [subscript DDQ] of future technology generations. |
|---|---|
| Item Description: | "Major Subject: Computer Engineering" Title from author supplied metadata (automated record created on Apr. 14, 2006.) Vita. Abstract. Electronic resource. |
| Format: | Mode of access: World Wide Web. System requirements: World Wide Web access and Adobe Acrobat Reader. |
| Bibliography: | Includes bibliographical references. |