Testing, reliability, and application of micro- and nano-material systems IV : 28 February-2 March 2006, San Diego, California, USA /

Bibliographic Details
Corporate Authors:	Society of Photo-optical Instrumentation Engineers, American Society of Mechanical Engineers, Intelligent Materials Forum (Mitō Kagaku Gijutsu Kyōkai), Jet Propulsion Laboratory (U.S.), National Science Foundation (U.S.)
Other Authors:	Geer, Robert E.
Format:	Book
Language:	English
Published:	Bellingham, Washington : SPIE, [2006]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 6175.
Subjects:	Electrooptical devices > Materials > Testing > Congresses. Photonics > Materials > Testing > Congresses. Nanostructured materials > Testing > Congresses. Microelectromechanical systems > Testing > Congresses.

Description
Physical Description:	1 volume (various pagings) : illustrations ; 28 cm.
Bibliography:	Includes bibliographical references and index.
ISBN:	0819462284