Cover Image

Independent component analyses, wavelets, unsupervised smart sensors, and neural networks III : 30 March-1 April 2005, Orlando, Florida, USA /

Show other versions (1)
Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, Ball Aerospace & Technologies Corporation
Other Authors: Szu, Harold H.
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2005]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 5818.
Subjects:
Multivariate analysis > Congresses.
Wavelets (Mathematics) > Congresses.
Neural networks (Computer science) > Congresses.
Detectors > Congresses.
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/5818.toc
Description
Item Description:First conference entitled: Independent component analyses, wavelets, and neural networks.
Physical Description:viii, 204 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819458031