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Eighth International Symposium on Laser Metrology : macro-, micro-, and nano-technologies applied in science, engineering, and industry : 14-18 February 2005, Merida, Yucatan, Mexico /

Bibliographic Details
Corporate Authors:	International Symposium on Laser Metrology Merida, Ycatan, Mexico, Centro de Investigaciones en Optica (León, Guanajuato, Mexico), International Measurement Confederation. Technical Committee on Measurement of Geometrical Quantities, Society of Photo-optical Instrumentation Engineers
Other Authors:	Rodriguez-Vera, R., Mendoza-Santoyo, F.
Format:	Conference Proceeding Book
Language:	English
Published:	Bellingham, Washington : SPIE, [2005]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 5776.
Subjects:	Measurement > Congresses. Optical measurements > Industrial applications > Congresses. Lasers > Industrial applications > Congresses. Laser interferometers > Congresses.

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