Nondestructive detection and measurement for homeland security III : 7-9 March 2005, San Diego, California, USA /

Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Diaz, Aaron A.
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2005]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 5769.
Subjects:
Description
Physical Description:v, 172 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819457507