Value analysis tear-down : a new process for product development and innovation /

Bibliographic Details
Main Author:	Sato, Yoshihiko
Other Authors:	Kaufman, J. Jerry
Format:	Book
Language:	English
Published:	New York : Industrial Press : Society of Manufacturing Engineers, 2005.
Edition:	1st ed.
Subjects:	Value analysis (Cost control) Industrial productivity. New products. Engineering economy.
Online Access:	Table of contents

by Sato, Yoshihiko
Published 2005

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