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Value analysis tear-down : a new process for product development and innovation /

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Bibliographic Details
Main Author: Sato, Yoshihiko
Other Authors: Kaufman, J. Jerry
Format: Book
Language:English
Published: New York : Industrial Press : Society of Manufacturing Engineers, 2005.
Edition:1st ed.
Subjects:
Value analysis (Cost control)
Industrial productivity.
New products.
Engineering economy.
Online Access:Table of contents
Description
Physical Description:x, 206 pages : illustrations ; 24 cm.
Bibliography:Includes bibliographical references (page 199) and index.
ISBN:0831132035 (professional/textbook : alk. paper)