http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
Image processing and pattern recognition in remote sensing II
8-9 November 2004, Honolulu, Hawaii, USA
Image processing and pattern recognition in remote sensing two
Image processing and pattern recognition in remote sensing 2
Society of Photo-optical Instrumentation Engineers
National Aeronautics and Space Administration.
viii, 128 pages : illustrations, maps ; 28 cm.
Yoshifumi Yasuoka, Stephen G. Ungar, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, NASA--National Aeronautics and Space Administration (USA) [and others].
Includes bibliographical references and index.
Proceedings of SPIE--the International Society for Optical Engineering ; v. 5657