Memory, microprocessor, and ASIC /

Memory & LSI : digest of papers /
Published: (1977)

System-on-chip test architectures : nanometer design for testability /
Published: (2008)

VLSI implementation of output convertors for ASIC architectures based on the residual number system : an overview /
by: Godbole, Rajesh, 1967-
Published: (1992)

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /
by: Bushnell, Michael L. (Michael Lee), 1950-
Published: (2000)

Digital MOS integrated circuits /
Published: (1981)

Power-constrained testing of VLSI circuits /
by: Nicolici, Nicola
Published: (2003)

Power-constrained testing of VLSI circuits /
by: Nicolici, Nicola
Published: (2003)

High performance memories : new architecture DRAMs and SRAMs--evolution and function /
by: Prince, Betty
Published: (1999)

IEEE VLSI Test Symposium : digest of papers.
Published: (1990)

Advanced research in VLSI and parallel systems : proceedings of the 1992 Brown/MIT conference /
Published: (1992)

Tutorial : LSI testing /
Published: (1978)

DSP integrated circuits /
by: Wanhammar, Lars
Published: (1999)

DSP integrated circuits /
by: Wanhammar, Lars
Published: (1999)

Power-constrained testing of VLSI circuits /
by: Nicolici, Nicola
Published: (2003)

Self-testing VLSI design /
by: I͡Armolik, V. N. (Vi͡acheslav Nikolaevich)
Published: (1993)

Rapid reliability assessment of VLSICs /
Published: (1990)

VLSI test principles and architectures : design for testability /
Published: (2006)

Proceedings : IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits : August 2-4, 1993, Cornell University, Ithaca, New York /
Published: (1993)

Towards the visual microprocessor : VLSI design and the use of cellular neural network universal machines /
Published: (2001)

VLSI-design of non-volatile memories /
by: Campardo, Giovanni
Published: (2005)

From contamination to defects, faults, and yield loss : simulation and applications /
by: Khare, Jitendra B.
Published: (1996)

Mosfet modeling for VLSI simulation : theory and practice /
by: Arora, N. (Narain), 1943-
Published: (2007)

Proceedings /
Published: (1996)

Hierarchical modeling for VLSI circuit testing /
by: Bhattacharya, Debashis, 1961-
Published: (1990)

Diagnostic measurements in LSI/VLSI integrated circuits production /
by: Jakubowski, Andrzej
Published: (1991)

Memory & LSI : digest of papers, 1974 Semiconductor Test Symposium, November 5-7, 1974 held at Cherry Hill, New Jersey, sponsored by IEEE Computer Society and the Philadelphia Section of the IEEE.
Published: (1974)

Design & test techniques for VLSI & WSI circuits /
Published: (1989)

Design automation, languages, and simulations /
Published: (2003)

LSI/VLSI testability design /
by: Tsui, Frank F.
Published: (1987)

Mixed analog-digital VLSI devices and technology : an introduction /
by: Tsividis, Yannis
Published: (1996)

VLSI electronics : microstructure science, volume 7 /
Published: (1983)

The physics of VLSI systems /
by: Keyes, Robert W., 1921-
Published: (1987)

VLSI 93 : proceedings of the IFIP TC10/WG10.5 International Conference on Very Large Scale Integration, Grenoble, France, 7-10 September, 1993 /
Published: (1994)

VLSI planarization : methods, models, implementation /
by: Feinberg, V.
Published: (1997)

The bounding approach to VLSI circuit simulation /
by: Zukowski, Charles A.
Published: (1986)

Characterization of very high speed semiconductor devices and integrated circuits : 23-25 March 1987, Bay Point, Florida /
Published: (1987)