APA (7th ed.) Citation

Hwang, J. Y., & Kuo, W. (2005). Spatial stochastic processes for yield and reliability management with applications to nano electronics. [Texas A&M University].

Chicago Style (17th ed.) Citation

Hwang, Jung Yoon, and Way Kuo. Spatial Stochastic Processes for Yield and Reliability Management with Applications to Nano Electronics. [College Station, Tex.]: [Texas A&M University], 2005.

MLA (9th ed.) Citation

Hwang, Jung Yoon, and Way Kuo. Spatial Stochastic Processes for Yield and Reliability Management with Applications to Nano Electronics. [Texas A&M University], 2005.