http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
Two- and three-dimensional vision systems for inspection, control, and metrology II
26-27 October 2004, Philadelphia, Pennsylvania, USA
Two- and three-dimensional vision systems for inspection, control and metrology two
Two- and three-dimensional vision systems for inspection, control and metology 2
Society of Photo-optical Instrumentation Engineers
Kevin G. Harding, chair/editor ; sponsored and published by by SPIE--the International Society for Optical Engineering ; technical cosponsor, IEICE Communications Society (Japan) ; in cooperation with, IEICE Electronics Society (Japan).
Includes bibliographical references and index.
Proceedings of SPIE--the International Society for Optical Engineering ; v. 5606