Advanced verification techniques : a systemC based approach for successful tapeout /
"As chip size and complexity continues to grow exponentially, the challenges of functional verification are becoming a critical issue in the electronics industry. It is now commonly heard that logical errors missed during functional verification are the most common cause of chip re-spins, and t...
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| Format: | eBook |
| Language: | English |
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Boston :
Kluwer Academic Publishers,
[2004]
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| Online Access: | Connect to the full text of this electronic book Connect to the full text of this electronic book |
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