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Stress-induced phenomena in metallization : Seventh International Workshop on Stress-Induced Phenomena in Metallization, Austin, Texas 14-16 June 2004 /

Bibliographic Details
Corporate Author: International Workshop on Stress-Induced Phenomena in Metallization Austin, Texas
Other Authors: Ho, P. S.
Format: Conference Proceeding Book
Language:English
Published: Melville, N.Y. : American Institute of Physics, 2004.
Series:AIP conference proceedings ; no. 741.
Subjects:
Semiconductors > Defects > Congresses.
Metallic films > Congresses.
Thin film devices > Defects > Congresses.
Aluminum films > Congresses.
Metallizing > Congresses.
Online Access:http://proceedings.aip.org/proceedings/confproceed/741.jsp
Description
Physical Description:vii, 272 pages : illustrations ; 25 cm.
Bibliography:Includes bibliographical references and indexes.
ISBN:0735402256
ISSN:0094-243X ;