| Tag |
First Indicator |
Second Indicator |
Subfields |
| LEADER |
00000pam a22000004a 4500 |
| 001 |
in00002024943 |
| 005 |
20151031180654.0 |
| 008 |
040224s2004 enka b 001 0 eng |
| 010 |
|
|
|a 2004045180
|
| 020 |
|
|
|a 0521453739
|
| 035 |
|
|
|a (OCoLC)ocm54529276
|
| 040 |
|
|
|a DLC
|c DLC
|d YDX
|d UtOrBLW
|
| 042 |
|
|
|a pcc
|
| 049 |
|
|
|a TXAM
|
| 050 |
0 |
0 |
|a QC176.84.S93
|b I24 2004
|
| 082 |
0 |
0 |
|a 530.4/275
|2 22
|
| 100 |
1 |
|
|a Ichimiya, Ayahiko,
|d 1940-
|
| 245 |
1 |
0 |
|a Reflection high-energy electron diffraction /
|c Ayahiko Ichimiya and Philip I. Cohen.
|
| 264 |
|
1 |
|a Cambridge, U.K. ;
|a New York :
|b Cambridge University Press,
|c 2004.
|
| 300 |
|
|
|a xi, 353 pages :
|b illustrations ;
|c 26 cm.
|
| 336 |
|
|
|a text
|b txt
|2 rdacontent
|
| 337 |
|
|
|a unmediated
|b n
|2 rdamedia
|
| 338 |
|
|
|a volume
|b nc
|2 rdacarrier
|
| 504 |
|
|
|a Includes bibliographical references (pages 335-349) and index.
|
| 650 |
|
0 |
|a Reflection high energy electron diffraction.
|
| 650 |
|
0 |
|a Thin films
|x Surfaces
|x Analysis.
|
| 700 |
1 |
|
|a Cohen, Philip I.
|
| 856 |
4 |
1 |
|3 Table of contents
|u http://www.loc.gov/catdir/toc/cam041/2004045180.html
|t 0
|
| 856 |
4 |
2 |
|3 Publisher description
|u http://www.loc.gov/catdir/description/cam041/2004045180.html
|t 0
|
| 945 |
|
|
|i PromptCat
|
| 948 |
|
|
|a cataloged
|b cmulkey
|c 2005/2/15
|d 1:41:38 pm
|
| 994 |
|
|
|a 92
|b TXA
|
| 999 |
|
|
|a MARS
|
| 999 |
f |
f |
|s 977970b3-6065-3cff-aec2-77c9ff154c4c
|i dc1a62fc-a4d6-3d02-9d45-b0f4cc71af97
|t 0
|
| 952 |
f |
f |
|p normal
|a Texas A&M University
|b College Station
|c Sterling C. Evans Library
|d Evans: Library Stacks
|t 0
|e QC176.84.S93 I24 2004
|h Library of Congress classification
|i unmediated -- volume
|m A14832290133
|
| 998 |
f |
f |
|a QC176.84.S93 I24 2004
|t 0
|l Evans: Library Stacks
|