Optical constants of materials for UV and x-ray wavelengths : 4-5 August 2004, Denver, Colorado, USA /

Bibliographic Details
Corporate Authors:	Society of Photo-optical Instrumentation Engineers, International Symposium on Optical Science and Technology
Other Authors:	Soufli, Regina, Seely, John F.
Format:	Conference Proceeding Book
Language:	English
Published:	Bellingham, Washington : SPIE, [2004]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 5538.
Subjects:	Thin films > Optical properties > Congresses. Refractive index > Measurement > Technique > Congresses. Optical constants > Congresses.
Online Access:	https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/5538.toc?SSO=1

Description
Item Description:	This conference was part of the program on X-Ray Systems and Technologies at SPIE's 49th Annual Meeting in Denver, Colorado.
Physical Description:	x, 172 pages : illustrations ; 28 cm.
Bibliography:	Includes bibliographical references and index.
ISBN:	0819454761 (pbk.)