Cover Image

Optical systems degradation, contamination, and stray light : effects, measurements, and control : 2-5 August 2004, Denver, Colorado, USA /

Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Chen, Philip T., Fleming, John C., Dittman, Michael G.
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2004]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 5526.
Subjects:
Space vehicles > Contamination > Congresses.
Space stations > Contamination > Congresses.
Space vehicles > Optical equipment > Congresses.
Description
Physical Description:viii, 274 pages : illustrations (some color) ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819454648