Cover Image

Improved high-resolution seismic profiling.

Bibliographic Details
Main Author: Krotser, Donald Jay
Corporate Author: Massachusetts Institute of Technology. Department of Geology and Geophysics
Format: Book
Language:English
Published: [Cambridge] : [M.I.T. Dept. of Geology and Geophysics], 1966.
Subjects:
Seismometry.
Description
Item Description:Issued also as a M.S. thesis in the M.I.T. Dept. of Geology and Geophysics, 1966.
Physical Description:51 pages : diagrams, photographs.
Bibliography:Bibliography: page 43.