Cover Image

Failure-free integrated circuit packages : systematic elimination of failures through reliability engineering, failure analysis, and material improvements /

Bibliographic Details
Other Authors: Cohn, Charles, Harper, Charles A.
Format: Book
Language:English
Published: New York : McGraw-Hill, [2004]
Series:McGraw-Hill professional engineering. Electronic engineering.
Subjects:
Integrated circuits.
Reliability (Engineering)
Description
Physical Description:xix, 363 pages : illustrations ; 24 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0071434844 (cased)