rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Stuck-at-fault test set compaction
  name:
    name part: Vanfickell, Jason Michael.
    role:
      role term: creator
  type of resource: text
  genre: bibliography
  origin info:
    place:
      place term: xx
    date issued: 2004
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: print
    extent: vii, 22 leaves : illustrations ; 28 cm.
  abstract: Proper testing of manufactured digital circuits is critical to ensuring the number of defective parts is minimized. Automated test pattern generation tools are created in order to produce test patterns that can be applied with the intention of identifying as many defective parts as possible. The increasing complexity of digital circuit designs causes this task to continue to increase in difficulty. At the same time, the amount of time dedicated to testing should be kept constant. Therefore, it is crucial to limit the number of test patterns that are applied to any given circuit. Additionally, tester memories may limit the number of test patterns that may be applied at one time. This research demonstrates several existing methods of compaction and introduces a new method for measuring the contribution of each test pattern. Both static and dynamic compaction methods were implemented and evaluated in terms of final test pattern set size and diversity of excitation. The program resulting from this research has been shown to equal or surpass an existing automated test pattern generation tool.
  note: by Jason Michael Vanfickell.
  note: Vita.
  note: "Major Subject: Computer Engineering".
  note: Fellows Thesis Texas A&M University 2004.
  note: Includes bibliographical references (leaf 21).
  subject:
    topic: Major computer engineering
  identifier: http://hdl.handle.net/1969.1/ETD-TAMU-2004-Fellows-Thesis-V36
  related item:
    location:
      url: http://hdl.handle.net/1969.1/ETD-TAMU-2004-Fellows-Thesis-V36
  record info:
    record content source: TXA
    record creation date: 041110
    record change date: 20151031134321.0
    record identifier: in00002000052